Miaofang Chi is a distinguished scientist at the Center for Nanophase Materials Sciences (CNMS) at ORNL. She received her Ph.D. in Materials Science and Engineering from the University of California, Davis in 2008. Prior to joining the Microscopy Group at ORNL in 2008, she was a visiting scholar at the National Center for Electron Microscopy at Lawrence Berkeley National Laboratory (2004-2006) and was a research fellow at Lawrence Livermore National laboratory (2006-2008). She was awarded the ORNL Director’s Award for Outstanding Individual Accomplishment in Science and Technology in 2015 and 2021; the Burton Metal by the Microscopy Society of America in 2016, and the the Kurt Heinrich Award from the Microanalysis Society (2019). She was named as Fellow of Microscopy Society of America class 2022. She has extensive research experience in the development and application of novel electron microscopy techniques for energy and quantum materials materials. Her current research focuses on understanding mass and electron transport and redistribution behavior at the atomic-scale at functional interfaces in materials and systems for energy storage, sustainability and quantum information science.
• 2021, Director’s Award for Outstanding Accomplishment in Science & Technology, ORNL.
• 2021, Distinguished Scientist, ORNL.
• 2021, 2020, 2018, Global highly cited researchers, Clarivate Analytics.
• 2019, the K.F.J. Heinrich Award, Microanalysis Society (MAS).
• 2019, DOE-BES Early Career Research Award.
• 2017, 2016, 2015, Significant Event Award, Oak Ridge National Laboratory.
• 2016, Burton Medal Award, Microscopy Society of America.
• 2015, Director’s Award for Outstanding Accomplishment in Science & Technology, ORNL.
• 2015, Early Career Researcher Award, ORNL.
• 2006-2008, Lawrence Graduate Student Research Fellowship at Lawrence Livermore National Lab, Livermore, CA.
• 2007, Distinguished Scholar Award (MAS), Microscopy & Microanalysis 2007 Annual Meeting, Fort Lauderdale, FL.
• 2007, Graduate Student Award, 11th Frontiers of Electron Microscopy in Materials Science Conference.