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Implementation of a portable diagnostic system for Thomson scattering measurements on an electrothermal arc source...

by Zichen He, Nischal Kafle, Gerald E Gebhart Iii, Theodore M Biewer, Zhili Zhang
Publication Type
Conference Paper
Journal Name
Review of Scientific Instruments
Publication Date
Page Number
Conference Name
High-Temperature Plasma Diagnostics (HTPD)
Conference Location
Rochester, New York, United States of America
Conference Sponsor
Conference Date

To fulfill the increasing needs of diagnostic support for researchers in plasma technology, a portable diagnostic package (PDP) equipped for both laser Thomson scattering (TS) and optical emission spectroscopy has been designed and constructed at Oak Ridge National Laboratory (ORNL), aiming to measure the temperature and number density of electrons and temperatures of ions in plasma devices. The PDP has been initially implemented on a high density and low temperature electrothermal arc source (ET-arc) at ORNL to test its TS capability. TS from the plasmas in the ET-arc has been obtained using the PDP. The electron temperature and number density were determined from TS spectra. These results were then compared to measurements from previous studies on the ET-arc. The TS diagnostic measured 0.8 ± 0.1, 1.3 ± 0.2, and 0.7 ± 0.1 eV and (4.4 ± 0.5) × 1021, (5.9 ± 0.7) × 1021, and (4.3 ± 0.5) x 1021 m-3, respectively, from three lines of sight that transect the plasma column.