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Fidelity Requirements with Fast Transients from Vsc-hvdc

by Suman Debnath, Suman Debnath, Jingfan Sun, Jingfan Sun
Publication Type
Conference Paper
Journal Name
Annual Conference of the IEEE Industrial Electronics Society (IECON)
Publication Date
Page Numbers
6007 to 6014
Volume
44
Issue
1
Conference Name
Annual Conference of the IEEE Industrial Electronics Society (IECON)
Conference Location
Washington DC, District of Columbia, United States of America
Conference Sponsor
IEEE