Investigation of Point Defects by Aberration-Corrected STEM and First-Principles Theory... Conference Paper November, 2008
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-corrected Electron Microscope with 0.5 ? Infor... Journal October, 2008
Atomic Resolution Study of the Interfacial Bonding at Si3N4/CeO_(2-d) Grain Boundaries... Journal August, 2008
3D Scanning Transmission Electron Microscopy for Catalysts: Imaging and Data Analysis... Conference Paper August, 2008
Strategic Research on Performance Optimization of YBa2Cu3O7 Coated Conductors... Conference Paper August, 2008
