Contrast Mechanisms in Secondary Electron e-Beam-Induced Current (SEEBIC) Imaging Journal October, 2022
Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy Journal October, 2022
Enabling Autonomous Electron Microscopy for Networked Computation and Steering Conference Paper October, 2022
Probing Temperature-Induced Phase Transitions at Individual Ferroelectric Domain Walls Journal October, 2022
Exploring Physics of Ferroelectric Domain Walls in Real Time: Deep Learning Enabled Scanning Probe Microscopy Journal September, 2022
Temperature-Assisted Piezoresponse Force Microscopy: Probing Local Temperature-Induced Phase Transitions in Ferroics Journal August, 2022
