An-Ping Li

An-Ping Li

Senior Research Staff


Chinese Academy of Sciences Solid State Physics M.S., 1991
Peking University, China Condensed Matter Physics Ph.D., 1997
Max-Plank-Institute, Germany Microstructure Physics Postdoctoral, 7/97-8/99

Professional Experience:
2002-present Research Associate/Staff/Senior Staff, Oak Ridge National Laboratory, USA
2015-present Theme Leader, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, USA
2009-present Adjunct Associate Professor/Joint Faculty Professor, The University of Tennessee, USA
2001-2002 Senior R&D Scientist, Project Leader, Galian Photonics Inc., Canada
1999-2001 Visiting Scientist, Center for Sensor Materials, NSF MRSEC, Michigan State University, USA
1997-1999 MPI Fellow, Max-Planck-Institute of Microstructure Physics, Halle, Germany

Synergistic Activities:
1. Organizing Committee Chair, Focus Topic on Scanning Probe Microscopy for AVS 62 International Symposium and Exhibition, 2015.
2. Session chair, APS March meeting, DMP Graphene Focus Topic, 2015.
3. Organizing Committee Chair, Focus Topic on Scanning Probe Microscopy for AVS 61 International Symposium and Exhibition, Nov 9-14, 2014.
4. Organizing Committee Member, Focus Topic on In Situ Spectroscopy and Microscopy for AVS 61 International Symposium and Exhibition, Nov 9-14, 2014.
5. Organizing Committee Co-Chair, AVS Focus Topic Conference, Scanning Probe Microscopy, 2013.
6. Organizing Committee Chair, AVS Focus Topic Conference, Electron Transport at the nanoscale, 2012.
7. Organizing Committee Member, AVS Focus Topic Conference, Scanning Probe Microscopy, 2012.
8. Organizing Committee Member, 3rd International Workshop on Nanoscale Imaging for Energy Applications, 2012.
9. Organizing Committee Chair, AVS Focus Topic Conference, Electron Transport in Low-Dimensional Materials, 2011.

Research Interest:
My primary interests have been the science-driven synthesis and the fundamental physical properties of low-dimensional materials. The research activities have involved in experimental determinations of structural, electronic, transport, magnetic, and optical properties for information and energy applications. Techniques employed are scanning probe microscopy (single-tip and multiple-tip), molecular beam epitaxy, self-assembly, and top-down nanofabrication.

Research topics include:
1. Electronic and Transport Properties in Low-Dimensional Materials. We perform both STM and transport measurements on the same sample areas to establish the structure-transport relations down to the atomic scale. New methodologies, such as spin-polarized STM, scanning tunneling potentiometry, and scanning tunneling thermopower microcopy are implemented to probe electronic and spin density of states, electrochemical potentials and thermoelectric voltages on material surfaces.

2. Controlled Synthesis of Low-Dimensional Materials. We synthesize 2D materials, thin films, and nanostructures, using chemical vapor deposition, molecular beam epitaxy, and a variety of bottom-up directed- and self-assembly processes. We then characterize these materials and study their electronic, magnetic, optical, and transport properties.

3. Metal-Insulator Transitions and Electronic Inhomogeneity in Correlated Electronic Materials. We image and manipulate competing electronic phases near the critical transitional points of complex oxide, and examine the quantum transport in correlation with electronic instability, electron localization, Coulomb blockade in quantum material systems from mesoscopic down to the atomic scale.

4. Magnetism and Spin-Dependent Transport in Magnetic Semiconductors and Quantum Dots. We study nanomagnetism in magnetic semiconductors and QDs, and investigate properties associated with impurity segregations, percolative magnetic transitions, metal-insulator transitions, and spin polarizations of the materials.


Performance Award, ORNL, 2015
Significant Event Award for Outstanding Research (SEA), ORNL, 2014
CNMS (inaugural) Division Award for Distinguished User Research, ORNL, 2014
Performance Award, ORNL, 2013
Max Planck Society Fellowship, Max Plank Society, Germany, 1997
Guanghua Scholarship for Graduate Research, Peking University, 1996
Science and Technology Progress Award, The Ministry of Electronics Industry of China, 1994
Outstanding Young Researcher Award, The Ministry of Electronics Industry of China, 1993


Selected 5 Recent Publications:

Jewook Park, Jaekwang Lee, Lei Liu, Kendal W. Clark, Corentin Durand, Changwon Park, Bobby G. Sumpter, Arthur P. Baddorf, Ali Mohsin, Mina Yoon*, Gong Gu*, and An-Ping Li*, “Spatially Resolved One-Dimensional Boundary States in Graphene-Hexagonal Boron Nitride Planar Heterostructures”, Nature Communications 5, 5403 (2014). doi: 10.1038/ncomms6403.

Lei Liu†, Jewook Park† (contributed equally), David A. Siegel, Kevin F. McCarty, Kendal W. Clark, Wan Deng, Leonardo Basile, J.-C. Idrobo, An-Ping Li*, Gong Gu*, “Heteroepitaxial Growth of Two-Dimensional Hexagonal Boron Nitride Templated by Graphene Edges”, Science 343, 163-167 (2014). DOI: 10.1126/science.1246137.

Jens Baringhaus, Ming Ruan, Frederik Edler, Antonio Tejeda, Muriel Sicot, Amina Taleb‐Ibrahimi, An-Ping Li, Zhigang Jiang, Edward Conrad, Claire Berge, Christoph Tegenkamp, Walt A. de Heer*, “Exceptional ballistic transport in epitaxial graphene nanoribbons”, Nature, 506,349–354 (2014). DOI: 10.1038/nature12952.

Kendal W. Clark, X.-G. Zhang, Gong Gu, Jewook Park, Guowei He, R. M. Feenstra, and An-Ping Li*, “Energy Gap Induced by Friedel Oscillations Manifested as Transport Asymmetry at Monolayer-Bilayer Graphene Boundaries”, Physical Review X 4, 011021 (2014). DOI: 10.1103/PhysRevX.4.011021.

Kendal W. Clark, X.-G. Zhang, Ivan V. Vlassiouk, Guowei He, R. M. Feenstra, and An-Ping Li*, “Spatially Resolved Mapping of Electrical Conductance around Individual Domain (Grain) Boundaries in Graphene”, ACS Nano. 7 (9), 7956-7966 (2013). DOI: 10.1021/nn403056k.


"Method for Error Correction in Scanning Tunneling Microscope Data” Xiaoguang Zhang, An-Ping Li, Yunmei Chen, Hao Zhang, Xianqi Li”, US Patent Disclosure, U.S. Serial No.: 62/361,397; WGS Ref. No.: U1198.70093US00 (2016).

“In-situ Scanning Tunneling Microscope Tip Treatment Device for Spin Polarization Imaging,” An-Ping Li, Jianxing Ma, and Jian Shen, US patent, US 7,361,893, 2008.

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