Gene E Ice Contact ICEGE@ORNL.GOV All Publications Short Focal Length Kirkpatrick-Baez Mirrors for a Hard X-Ray Nanoprobe Nondestructive Three-Dimensional Characterization of Grain Boundaries by X-Ray Crystal Microscopy... X-ray Microbeam Measurements of Subgrain Stress Distributions in Polycrystalline Materials... Polychromatic X-Ray Microdiffraction Studies of Mesoscale Structure and Dynamics... Characterization of Stress Relaxation, Dislocations and Crystallographic Tilt Via X-ray Microdiffraction in GaN (0001) Layers... Multiscale characterization of deformation mechanisms in the weld joint of a nickel-based superalloy X-ray Microbeam Diffraction Measurements in Polycrystalline Aluminum and Copper Thin Films... Three-Dimensional Micron-Resolution X-Ray Laue Diffraction Measurement of Thermal Grain-Evolution in Aluminum Profile Coatings and their Applications Pagination First page « First Previous page ‹‹ … Page 3 Page 4 Current page 5
