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Characterization of Stress Relaxation, Dislocations and Crystallographic Tilt Via X-ray Microdiffraction in GaN (0001) Layers...

Publication Type
Conference Paper
Book Title
Thin Films-Stresses and Mechanical Properties XI
Publication Date
Page Numbers
115 to 120
Volume
875
Conference Name
MRS 2005 Spring Proceedings
Conference Location
San Francisco, California, United States of America
Conference Date
-