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Virtual Slit for Improved Resolution in Longitudinal Emittance Measurement...

by Kiersten J Ruisard, Alexander V Aleksandrov, Andrei P Shishlo
Publication Type
Conference Paper
Book Title
Proceedings of the 9th Int. Beam Instrum. Conf.
Publication Date
Page Numbers
241 to 245
Publisher Location
Geneva, Switzerland
Conference Name
International Beam Instrumentation Conference IBIC20
Conference Location
Virtual (originally Santos), Brazil
Conference Sponsor
CNPEM/LNLS
Conference Date
-

A technique to reduce point-spread originating from physical slit width in emittance measurements is described. This technique is developed to improve phase resolution in a longitudinal emittance apparatus consisting of a dipole magnet, energy-selecting slit and bunch shape monitor. In this apparatus, the energy and phase resolutions are directly proportional to the width of the slit, but the virtual slit method enables sub-slit resolution. The bunch phase profile is measured at two points in the energy distribution with a separation less than the physical slit width. The difference of these two profiles is used to reconstruct the profile from a virtual slit of width equal to the separation.