Publication Type
Book Chapter
Publication Date
Page Numbers
117 to 160
Publisher Name
Springer
Publisher Location
New York, New Jersey, United States of America
Abstract
The electron Ronchigram is a form of inline hologram that offers a convenient way to directly see and measure
electron optical aberrations. Any user of an aberration-corrected STEM is likely to benefit from a basic understanding
of how such an image is formed and used. This chapter will review the formation of the electron Ronchigram with
a particular emphasis on the effects and measurement of aberrations. This review will be largely based on our own
approach and previously published work.
