Xenocs Xeuss 2.0 & 3.0 Small- and Wide-Angle X-ray scattering (SAXS/WAXS) System

Small- and wide-angle X-ray scattering (SAXS/WAXS) is widely used for structural characterization of nanomaterials, such as polymers, nanocomposites, patterned structures, thin films, gels and biological samples. The Xenocs Xeuss 2.0 & 3.0 SAXS/WAXS system is utilized to investigate the structures of such materials on a sub-nanometer to hundreds of nanometers scale. 

Specifications/Capabilities/Extras

• D2+ 70 kV Liquid MetalJet X-ray source.
• Eiger2 R 4M and Pilatus 1M photon-counting X-ray detector.
• Covered Q range: 0.003 Å^-1 ~ 5.5 Å^-1.
• 27 positions capillary holder, 26 positions solid sample holder, 15 positions thin film sample holder, 8 positions powder/gel sample holder.
• Standard and advanced grazing Incidence (GI-) SAXS/WAXS stage.
• Capillary heater (10°C ~ 80°C) for in-situ SAXS/WAXS measurements.
• Linkam TST350 tensile stage (RT ~ 350°C) for in-situ SAXS/WAXS measurements.
• Linkam DSC450 DSC (RT - 350°C) for in-situ SAXS/WAXS measurements.

Applications

The Xenocs Xeuss 2.0 & 3.0 SAXS/WAXS system, employing a liquid metal jet X-ray source with high power density and small beam divergence, enables the characterization of the structure at a much faster data acquisition speed with better precision and accuracy. Specifically, the significantly higher brightness than any other available microfocus X-ray source and the closest possible to synchrotron performance permits the design of time-resolved, in-situ or operando SAXS/WAXS experiments during material synthesis, chemical reaction, phase transition and materials processing.