The PANalytical X’Pert Pro MRD is a multipurpose x-ray diffractometer that is capable of high- and low-resolution measurements for thin-film characterization using techniques such as x-ray reflectivity, reciprocal space mapping, rocking curve analysis, theta-2theta scans, and texture analysis.
Features
- 1.8kW Cu Kα source
- High flux hybrid monochromator
- Automatic beam attenuator
- Receiver slits and Ge analyzer
- Sealed Xe proportional counter
- 127 mm diam stage
±50 mm translation in X and Y
Sample thickness limited to ≤9 mm
Multiple sample capable
- Vacuum option
- Open horizontal goniometer
- Scriptable measurement sequences