Skip to main content

Nanoscale Thermal Microscopy

Nanoscale Thermal Microscopy

FAFM Thermal AFM art graphics

By aligning a UV laser perpendicular to an atomic force microscope cantilever it becomes possible to concurrently measure all different sorts of functional properties in contact mode as they vary with temperature. This approach offers valuable insights into the localized characteristics of phase transitions. Additionally, this technique can be utilized to measure the local thermal conductivity.

Of particular interest, it is the combination of thermally modulated cantilevers with nanomechanical measurements, using for example contact ressonance frequency AFM or pieroelectric measurements utilizing band excitation piezoresponse spectroscopy. 


Available modes:

  • Scanning Thermal Microscopy (SThM)
  • Thermic Probe Microscopy (ThAFM)
  • Thermal lithography


  • Sample size: 12x12 mm
  • Scan range: 30x30 um 
  • Z height limit: <10 µm
  • Temperature range: 25-500C
  • Compatible with automated experiments


Local Curie temperature in ferroelectric materials

Local melting and glass transition temperature in polymers

Reversible and irreversible thermal processes


Asylum Research Cypher AFM


Anna N. Morozovska, Eugene A. Eliseev, Kyle Kelley, and Sergei V. Kalinin, “Temperature-Assisted Piezoresponse Force Microscopy: Probing Local Temperature-Induced Phase Transitions in Ferroics” Phys. Rev. Applied 18, 024045

Kyle P. Kelley, Sergei V. Kalinin, Eugene Eliseev, Shivaranjan Raghuraman, Stephen Jesse, Peter Maksymovych, Anna N. MorozovskaProbing Temperature-Induced Phase Transitions at Individual Ferroelectric Domain WallsAdv. Elec. Mater, 9(1):2200552, 2023

M.Checa, K.P Kelley, R Vasudevan,L Collins and S Jesse, “Automated piezoresponseforce microscopy domain tracking during fast thermally stimulatedphasetransitioninCuInP2S6” Nanotechnology 34(2023)325703


Thermal dependent measurements and phase transitions