The Malvern PANalytical X’Pert Pro MPD X-Ray Diffraction (XRD) system is utilized for the identification of crystalline phase structure and quantitative phase analysis through Rietveld refinements.
Specifications/Capabilities/Extras
- X-ray generation at a tube voltage of 45kV and a tube current of 40 mA.
- Maximum 2θ measurement range: 3° < 2θ ≤ 135° and 2theta resolution: ~0.002°.
- X’celerator 1D position sensitive detector
- Hot and cryogenic sample stages for in-situ XRD measurements during chemical reaction and phase transition: Anton Paar XRK-900 (25 °C ~ 900 °C), Anton Paar TTK-450 (-190 °C ~ 450 °C) and Oxford Phenix Cryostat (12 K ~ 300 K).
- Sample spinner with automatic sample changer (15 samples).
- Various gas environments: Inert and reactive gases, and vacuum.
- International Centre for Diffraction Data (ICDD) is provided for phase identification.
Applications
The Malvern PANalytical X’Pert Pro MPD XRD employing X'Celerator detector in combination with various in-situ sample environments such as Anton Paar XRK-900, Anton Paar TTK-450 and Oxford Phenix Cryostat enables in-situ temperature variable XRD measurements to identify chemical reactions and crystal phase transitions. Additionally, an automatic sample changer makes it possible to load and measure up to 15 samples for convenient and effective utilization of the instrument.
