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Malvern PANalytical Aeris Benchtop X-Ray Diffraction (XRD) System

Malvern PANalytical Aeris Benchtop X-Ray Diffraction (XRD) System

The Malvern Panalytical Aeris XRD system is used for determining the chemical and phase structure of materials and, where relevant, identifying phase fractions of mixed samples by Rietveld refinement.


  • X-ray generation at a tube voltage of 40kV and a tube current of 15 mA.
  • Maximum 2θ measurement range: 3° < 2θ ≤ 142° and 2theta resolution: 0.001°.
  • Automatic external sample loading with a 6-position automatic sample changer.
  • Sample holders for ambient and air-sensitive samples.
  • X-ray detector: PIXel1D strip detector.
  • International Centre for Diffraction Data (ICDD) is provided for phase identification.


As a plug-and-play type XRD system, Malvern Panalytical's Aeris is suitable for quickly obtaining precise X-ray diffraction results. Phase identification, quantitative analysis, and polymorph analysis are facilitated by Rietveld refinement based on ICDD.