Using neutrons to see the additive manufacturing process at the atomic level, scientists have shown that they can measure strain in a material as it evolves and track how atoms move in response to stress.
As current courses through a battery, its materials erode over time. Mechanical influences such as stress and strain affect this trajectory, although their impacts on battery efficacy and longevity are not fully understood.
Since its inception in 2010, the program bolsters national scientific discovery by supporting early career researchers in fields pertaining to the Office of Science.
Few things carry the same aura of mystery as dark matter. The name itself radiates secrecy, suggesting something hidden in the shadows of the Universe.
Critical Materials Institute researchers at Oak Ridge National Laboratory and Arizona State University studied the mineral monazite, an important source of rare-earth elements, to enhance methods of recovering critical materials for energy, defense
The Department of Energy’s Oak Ridge National Laboratory has exclusively licensed battery electrolyte technology to Safire Technology Group.
To solve a long-standing puzzle about how long a neutron can “live” outside an atomic nucleus, physicists entertained a wild but testable theory positing the existence of a right-handed version of our left-handed universe.
Researchers at Oak Ridge National Laboratory are using state-of-the-art methods to shed light on chemical separations needed to recover rare-earth elements and secure critical materials for clean energy technologies.
ORNL scientists will present new technologies available for licensing during the annual Technology Innovation Showcase. The event is 9 a.m. to 3 p.m. Thursday, June 16, at the Manufacturing Demonstration Facility at ORNL’s Hardin Valley campus.
Researchers at ORNL are teaching microscopes to drive discoveries with an intuitive algorithm, developed at the lab’s Center for Nanophase Materials Sciences, that could guide breakthroughs in new materials for energy technologies, sensing and computing