Invention Reference Number
Neutron scattering experiments cover a large temperature range in which experimenters want to test their samples. Commonly used equipment can cool and heat samples in ranges from about 10K up to 750K, but the thermometry cannot provide accurate readings below 28K; thermometers that read lower than this temperature will not survive the high temperature environment. This technology is a sapphire isolated diode (SID) that enables low temperature measurements of equipment and samples in systems that previously could not be measured. Scientists either do not know the temperature of their sample at low temperatures or they must run multiple sample environments or in different configurations. This technology uses a sapphire crystal that functions as a heat switch to allow conduction at low temperatures and protection of the sensor at high temperatures.
Description
This invention is a sensor on the hot side of neutron scattering equipment that normally would not survive high temperatures. It uses a sapphire crystal to function as a heat switch for the thermometer, allowing the system to operate the full temperature range and providing accurate temperature readings at low temperatures. Current technology does not register the full temperature range. This invention allows the system to heat while the thermometer survives the harsh environment. It is essentially a sapphire sandwich that functions as a heat switch, acting as an insulator at high temperatures and a conductor at low temperatures.
Benefits
- Enables more accurate data measurements
- Survives high temperatures
- Provides readings below 28K
- Provides full range of temperatures readings
- Acts as heat switch, conducts and insulates
Applications and Industries
- Neutron scattering research
- Any research facility with wide temperature ranges
- X-ray scattering
Contact
To learn more about this technology, email partnerships@ornl.gov or call 865-574-1051.
