Vilmos Kertesz

Interim Group Leader

I have 25+ years of experience in analytical chemistry focusing on mass spectrometry fundamentals, instrumentation and applications. I am also an expert in computer programming with focuses on instrument control and interface development. My major interest is in mass spectrometry-based chemical profiling/imaging techniques for the chemical characterization of surfaces.

One aspect of my research is focused on coupling of ambient surface sampling for mass spectrometry based chemical imaging and surface profiling. We are inventing the next generation of chemical surface analysis tools that will provide high spatial resolution (micrometer range), sensitive, selective absolute quantitation profiling with the widest possible chemical coverage 

 

Education

1994 - Eotvos Lorand University, Budapest, Hungary M.Sc. - Chemistry

1995 - Eotvos Lorand University, Budapest, Hungary M.Sc. - Chemistry, teacher

1997 - Eotvos Lorand University, Budapest, Hungary Ph.D. - Electrochemistry

 

Professional Experience

2018-present Interim Group Leader, Mass Spectrometry and Laser Spectroscopy Group, Chemical Sciences Division, Oak Ridge National Laboratory

2012-2018 Research Staff, Mass Spectrometry and Laser Spectroscopy Group, Chemical Sciences Division, Oak Ridge National Laboratory

2011-2012 Associate Professor, Department of Physics and Chemistry, Szechenyi Istvan University, Gyor, Hungary

2006-2011 Research Staff, Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory

2004-2006 Postdoctoral Research Associate, Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory

2001-2004 Head of Electrochemical Software Development, Macasoft Bt., Gyor, Hungary

2000-2001 Postdoctoral Research Associate, Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory

1998-2000 Postdoctoral Research Associate, University of Tennessee, Knoxville, TN

Awards

2017 R&D 100 Award, “dropletProbe Surface Sampling Interface for Mass Spectrometry”
2017 FLC Excellence in Technology Transfer, “SCIEX License of ORNL’s Open Port Sampling Interfaces for Mass Spectrometry”
2016 R&D 100 Award, “Open Port Sampling Interfaces for Mass Spectrometry”
2015 Analytical & Bioanalytical Chemistry - Best Paper Award, corresponding author
2013 Rapid Communications in Mass Spectrometry - Beynon Prize”
2010 R&D 100 Award, “Liquid Microjunction Surface Sampling Probe for Mass Spectrometry”
2009 FLC Southeast Region Excellence in Technology Transfer Project of the Year, “Surface Sampling Probe for Mass Spectrometry

Patents

S. Margittai, J. Bacskai, G. Inzelt, V. Kertész
Mass measurement using quartz crystal microbalance
Announcement day: 1996/06/25.
Patent granted: 1999/11/10.
Patent number: 217482 (Hungary)
G.J. Van Berkel, M.J. Ford, V. Kertesz
Automated Position Control of a Surface Array Relative to a Liquid Microjunction Surface Sampler
Patent granted: November 13, 2007
Patent number: 7,295,026 (U.S.A)
G.J. Van Berkel, M.J. Ford, V. Kertesz
Control of the Positional Relationship Between a Sample Collection Instrument and a Surface to be Analyzed During a Sampling Procedure with Image Analysis
Patent granted: August 9, 2011
Patent number: 7,995,216 B2 (U.S.A)
V. Kertesz, G.J. Van Berkel
Electrospray Ion Source with Reduced Analyte Electrochemistry
Patent granted: August 23, 2011
Patent number: 8,003,937 B2 (U.S.A)
V. Kertesz, G.J. Van Berkel
Pulsed Voltage Electrospray Ion Source and Method Preventing Analyte Electrolysis
Patent granted: December 27, 2011
Patent number: 8,084,735 (U.S.A)
G.J. Van Berkel, V. Kertesz
Control of the Positional Relationship between a Sample Collection Instrument and a Surface to be Analyzed during a Sampling Procedure using a Laser Sensor.
Patent granted:: February 21, 2012
Patent number: 8,117,929 (USA)
V. Kertesz, G.J. Van Berkel
Electrospray Ion Source with Reduced Analyte Electrochemistry
Patent granted: July 30, 2013
Patent number: 8,497,473 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
Systems and Methods for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: August 27, 2013
Patent number: 8,519,330 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
System and Method for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: January 28, 2014
Patent number: 8,637,813 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
Systems and Methods for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: June 3, 2014
Patent number: 8,742,338 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
System and Method for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: September 29, 2015
Patent number: 9,146,180 B2 (U.S.A)
V. Kertesz, G.J. Van Berkel
System and Method for Liquid Extraction Electrospray-Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: July 12, 2016
Patent number: 9,390,901 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz
Method and System for Formation and Withdrawal of a Sample from a Surface to be Analyzed
Patent granted: October 3, 2017
Patent number: 9,779,926 B2 (U.S.A)
V. Kertesz, G.J. Van Berkel
Capture Probe
Patent granted: August 28, 2018
Patent number: 10,060,838 B2 (U.S.A)

Trademarks

COPYRIGHT - HandsFree Surface Analysis – TXu 1-685-968, May 9, 2008
COPYRIGHT - LMJ Points Plus v2.6 – TXu 1-880-737, July 25, 2013
COPYRIGHT - Universal Point Plus v1.1 - – TXu 1-889-461, November 6, 2013
COPYRIGHT/LICENSED - DropletProbe Premium v1.20l – TXu 2-000-1364, September 10, 2015