Vilmos Kertesz

Group Leader

EducationEotvos Lorand University, Budapest, Hungary M.Sc. 1994 ChemistryEotvos Lorand University, Budapest, Hungary M.Sc. 1995 Chemistry, teacherEotvos Lorand University, Budapest, Hungary Ph.D. 1997 ElectrochemistryResearch and Professional Experience: 2012-present Research Staff, Mass Spectrometry and Laser Spectroscopy Group, Oak Ridge National Laboratory2011-2012 Associate Professor, Department of Physics and Chemistry, Szechenyi Istvan University, Gyor, Hungary2006-2011 Research Staff, Organic & Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory2004-2006 Postdoctoral Research Associate, Organic & Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory2001-2004 Head of Electrochemical Software Development, Macasoft Bt., Gyor, Hungary2000-2001 Postdoctoral Research Associate, Organic & Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory1998-2000 Postdoctoral Research Associate, University of Tennessee, Knoxville, TN

Awards

2017 R&D 100 Award, “dropletProbe Surface Sampling Interface for Mass Spectrometry”
2017 FLC Excellence in Technology Transfer, “SCIEX License of ORNL’s Open Port Sampling Interfaces for Mass Spectrometry”
2016 R&D 100 Award, “Open Port Sampling Interfaces for Mass Spectrometry”
2015 Analytical & Bioanalytical Chemistry - Best Paper Award, corresponding author
2013 Rapid Communications in Mass Spectrometry - Beynon Prize”
2010 R&D 100 Award, “Liquid Microjunction Surface Sampling Probe for Mass Spectrometry”
2009 FLC Southeast Region Excellence in Technology Transfer Project of the Year, “Surface Sampling Probe for Mass Spectrometry

Facilities

CNMS

Patents

S. Margittai, J. Bacskai, G. Inzelt, V. Kertész
Mass measurement using quartz crystal microbalance
Announcement day: 1996/06/25.
Patent granted: 1999/11/10.
Patent number: 217482 (Hungary)
G.J. Van Berkel, M.J. Ford, V. Kertesz
Automated Position Control of a Surface Array Relative to a Liquid Microjunction Surface Sampler
Patent granted: November 13, 2007
Patent number: 7,295,026 (U.S.A)
G.J. Van Berkel, M.J. Ford, V. Kertesz
Control of the Positional Relationship Between a Sample Collection Instrument and a Surface to be Analyzed During a Sampling Procedure with Image Analysis
Patent granted: August 9, 2011
Patent number: 7,995,216 B2 (U.S.A)
V. Kertesz, G.J. Van Berkel
Electrospray Ion Source with Reduced Analyte Electrochemistry
Patent granted: August 23, 2011
Patent number: 8,003,937 B2 (U.S.A)
V. Kertesz, G.J. Van Berkel
Pulsed Voltage Electrospray Ion Source and Method Preventing Analyte Electrolysis
Patent granted: December 27, 2011
Patent number: 8,084,735 (U.S.A)
G.J. Van Berkel, V. Kertesz
Control of the Positional Relationship between a Sample Collection Instrument and a Surface to be Analyzed during a Sampling Procedure using a Laser Sensor.
Patent granted:: February 21, 2012
Patent number: 8,117,929 (USA)
V. Kertesz, G.J. Van Berkel
Electrospray Ion Source with Reduced Analyte Electrochemistry
Patent granted: July 30, 2013
Patent number: 8,497,473 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
Systems and Methods for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: August 27, 2013
Patent number: 8,519,330 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
System and Method for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: January 28, 2014
Patent number: 8,637,813 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
Systems and Methods for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: June 3, 2014
Patent number: 8,742,338 B2 (U.S.A)
G.J. Van Berkel, V. Kertesz, O.S. Ovchinnikova
System and Method for Laser Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: September 29, 2015
Patent number: 9,146,180 B2 (U.S.A)
V. Kertesz, G.J. Van Berkel
System and Method for Liquid Extraction Electrospray-Assisted Sample Transfer to Solution for Chemical Analysis
Patent granted: July 12, 2016
Patent number: 9,390,901 B2 (U.S.A)
Applications:United States Patent Application Serial No. 20100224013 A1 (Filed: March 5, 2009), "Method and System for Formation and Withdrawal of a Sample from a Surface to be Analyzed."

United States Patent Application Serial No. 14/682,847 (Filed April 9, 2015). Capture Probe

Specialized Equipment

Mass spectrometryHPLCAutosamplerAFMLaser ablationElectrochemical potentiostat

Trademarks

CopyrightsHandsFree Surface Analysis – TXu 1-685-968, May 9, 2008LMJ Points Plus v2.6 – TXu 1-880-737, July 25, 2013Universal Point Plus v1.1 - – TXu 1-889-461, November 6, 2013DropletProbe Premium v1.20l – TXu 2-000-1364, September 10, 2015