Olga S Ovchinnikova

Olga S Ovchinnikova

Staff Scientist

Bio

Education/Training:

University of Tennessee Chemical Physics Ph.D. 2011
University of Tennessee Chemical Physics M.S. 2007
University of Tennessee Physics B.S. 2005

Research Interests
Investigating relationships between physical structure and chemical functionality at the nanoscale through the development of multimodal imaging platforms; coregistration of multidimensional data, local tuning of material properties at interfaces using ion beams; in-situ helium ion microscopy for direct-write nanomanufacturing.

1. Local tuning of chemical functionality in materials.
Engineering control in functional materials using helium and neon ion beams; investigating relationships between physical structure and chemical functionality through local tuning of material properties using a scanning helium ion microscope, probing the resultant material functionality using advanced scanning probe and optical spectroscopy; development of in-situ helium ion microscopy to understand influence of local structure on chemical dynamics and ion beam interactions.

2. Multimodal chemical imaging techniques.
Development of multimodal imaging platforms for probing chemical and physical makeup and dynamic processes ongoing at interfaces. Linking structural information obtained via chemical imaging with other spectroscopic data to provide a direct correlation between chemical composition and material functionality.

Awards

2013 Winner of RCMS Beynon Prize
2011 Winner of Fowler-Marion Graduate Student Award/ Dept. of Physics, Univ. of Tenn
2010 Winner of Poster Competition, ASMS Asilomar Conference
2010 ASMS Asilomar Conference Student Travel Award
2010 Second Place Winner, Sigma Xi Graduate Research Student Competition/ University of Tennessee
2010 Materials Research Society (MRS) Spring Meeting Student Travel Award
2009 Awarded Jim McConnel Endowment Funding
2006 Graduate Chemical Physics Fellowship/ University of Tennessee
2006 National Institute of Standards and Technology Graduate Research Fellowship
2005 Honorable Mention, National Science Foundation (NSF) Graduate Research Fellowship
2005 Chancellor’s Honors Award for “Outstanding Professional Promise” for the Arts and Science/Univ. of Tenn.
2005 Robert Talley Award for Outstanding Undergraduate Leadership/ Dept. of Physics, Univ. of Tenn.
2004 George and Hattie Morris Scholarship Endowment Fund
2004 Society of Physics Students (SPS) Outstanding Student Award for Undergraduate Research
2004 Robert Talley Award for Outstanding Undergraduate Leadership/ Dept. of Physics, Univ. of Tenn.
2004 Winner, Exhibition of Undergraduate Research & Creative Achievement, Natural Science Div., Univ. of Tenn.
2004 Summer Undergraduate Research Fellowship, NIST Boulder
2003 NSF/ University of Colorado, Boulder, Summer REU Fellowship
2003 Robert W. Lide Citation for Outstanding Physics Laboratory Development/ Dept. of Phys., Univ. of Tenn.
2003 Society of Physics Students (SPS) and ΣΠΣ Undergraduate Research Grant
2003 Honorable Mention, American Association for the Advancement of Science (AAAS) Poster Competition
2002 DOE Energy Research Undergraduate Laboratory Fellowship

Publications

(22)Yang, B., Keum, J., Ovchinnikova, O.S., Belianinov, A., Chen, S., Du, M.-H., Ivanov, I.N., Rouleau, C.M., Geohegan, D.B., Xiao, K. “Deciphering Halogen Competition in Organometallic Halide Perovskite Growth.” J. Am. Chem. Soc. (2016), 10.1021/jacs.5b13254.
(21) Pudasaini, P.R., Noh, J.H., Wong, A.T., Ovchinnikova, O.S., Haglund, A.V., Dai, S. Ward, T.Z., Mandrus, D., Rack, P.D. “Ionic Liquid Activation of Amorphous Metal‐Oxide Semiconductors for Flexible Transparent Electronic Devices.” Adv. Func. Mat.. (2016), 10.1002/adfm.201505274.
(20) Iberi, V., Ievlev, A.V., Vlassiouk, I., Jesse, S., Kalinin, S.V., Joy, D., Rondinone, A.J., Ovchinnikova, O.S. “Graphene Engineering by Neon Ion Beams.” Nanotechnology. (2016) 27, 125302.
(19)Belianinov, A., Iberi, V., Tselev, A., Susner, M., McGuire, M., Joy, D., Jesse, S., Rondinone, A.J., Kalinin, S.V., Ovchinnikova, O.S. “Polarization control via He-ion beam induced nanofabrication in layered ferroelectric semiconductors.” ACS Appl. Mat Inerfaces. (2016) DOI: 10.1021/acsami.5b12056.
(18)Ovchinnikova, OS., Tai,T., Bocharova, V., Okatan, MB., Belianinov, A., Kertesz, V., Jesse, S., Van Berkel, GJ. “Co-registered Topographical, Band-Excitation Nanomechanical and Mass Spectral Imaging using a Combined Atomic Force Microscopy/Mass Spectrometry Platform.” ACS Nano (2015), 9, 4260-4269.
(17)Cahill, JF., Kertesz, V., Ovchinnikova, OS., Van Berkel, GJ. “Comparison of Internal Energy Distributions of Ions Created by Electrospray Ionization and Laser Ablation-Liquid Vortex Capture/Electrospray Ionization.” J. Am. Soc. Mass Spectrom. (2015), 26, 1462-1468.
(16)Kumar, R., Bocharova, V., Strelcov, E., Tselev, A., Kravchenko, I., Berdzinski, S., Strehmel, V., Ovchinnikova, OS., Sangoro, JR., Agapov, AL., Sokolov, AP., Kalinin, SV., Sumpter, BG. “Ion transport and softening in a polymerized ionic liquid.” Nanoscale, (2015), 7, 947-955.
(15)Kolbus, L., Payzant, E., Cornwell, P., Watkins, T., Babu. S., DeHoff, R., Lorenz, M., Ovchinnikova, OS., Duty, C. “Comparison of residual stresses in Inconel 718 simple parts made by electron beam melting and direct laser metal sintering” Met. Trans A, (2015), 46A, 1419-1432.
(14)Ovchinnikova, OS., D. Bhandari, Lorenz, M., Van Berkel, GJ. “Transmission geometry laser ablation into a non-contact liquid vortex capture probe for mass spectrometry imaging.” Rapid. Commun. Mass Spectrom, (2014), 28, 1665-1673.
(13)Lorenz, M., Ovchinnikova, OS., Van Berkel, GJ. “Fully Automated Laser Ablation Liquid Capture Sample Analysis using NanoElectrospray Ionization Mass Spectrometry.” Rapid. Commun. Mass Spectrom, (2014), 28, 1312-1320.
(12)Lorenz, M., Ovchinnikova, OS., Kertesz, V., Van Berkel, GJ. “Controlled-Resonant Surface Tapping-Mode Scanning Probe Electrospray Ionization Mass Spectrometry Imaging.” Anal. Chem., (2014), 86, 2146-3152.
(11)Ovchinnikova, OS., Kjoller, K., Hurst, GB., Pelletier, DA., Van Berkel, GJ. “Atomic Force Microscope Controlled Topographical Imaging and Proximal Probe Thermal Desorption/Ionization Mass Spectrometry Imaging.” Anal. Chem., (2014), 86, 1083-1090.
(10)Ovchinnikova, OS., Lorenz, M., Kertesz, V., Van Berkel, GJ. “Laser Ablation Sampling of Materials Directly into the Formed Liquid Microjunction of a Continuous Flow Surface Sampling Probe/Electrospray Ionization Emitter for Mass Spectral Analysis and Imaging.” Anal. Chem., (2013), 85, 10211-10217.
(9)Lorenz, M., Ovchinnikova, OS., Kertesz, V., Van Berkel, GJ. “Laser Microdissection and Atmospheric Pressure Chemical Ionization Mass Spectrometry Coupled for Multimodal Imaging.” Rapid. Commun. Mass Spectrom, (2013), 27, 1429-1436.
(8)Ovchinnikova, OS., Kertesz, V., Van Berkel, GJ. Combining Transmission Geometry Laser Ablation and a Non Contact Continuous Flow Surface Sampling Probe/Electrospray Emitter for Mass Spectrometry Based Chemical Imaging. Rapid Comm. Mass Spectrom. (2011) 25, 3735-3740.
(7)Ovchinnikova, OS., Nikiforov, M., Jesse, S., Bradshaw, JA. Van Berkel GJ. Combined Atomic Force Microscope-Based Topographical Imaging and Nanometer Scale Resolved Proximal Probe Thermal Desorption/Electrospray Ionization-Mass Spectrometry. ACS Nano (2011), 5, 5526-5531. (Article Featured as Podcast for ACS Nano)
(6)Ovchinnikova, OS., Kertesz, V., Van Berkel, GJ. Combining Laser Ablation Surface Sampling and Electrospray-Ionization via Liquid Extraction. Anal. Chem. (2011), 83, 1874-1878.
(5)Ovchinnikova, OS., Kertesz, V., Van Berkel, GJ. Molecular Surface Sampling and Chemical Imaging using Proximal Probe Thermal Desorption/Secondary Ionization Mass Spectrometry. Anal. Chem. (2011), 83, 598-603.
(4)Ovchinnikova, OS, Van Berkel GJ. Thin Layer Chromatography and Mass Spectrometry Coupled using Proximal Probe Thermal Desorption with Electrospray or Atmospheric Pressure Chemical Ionization. Rapid. Comm. Mass Spectrom. (2010), 24, 1721-1729.
(3)Bradshaw, JA., Ovchinnikova OS., Meyer, KA., Goeringer, DE. Combined chemical and topographic imaging at atmospheric pressure via microprobe laser desorption/ionization mass spectrometry-atomic force microscope. Rapid. Comm. Mass Spectrom. (2009), 23, 3871-3786.
(2)Meyer, KA., Ovchinnikova, O., Ng, K., Goeringer, DE. Development of a scanning surface probe for nanoscale tip-enhanced desorption/ablation. Rev. Sci. Instrum. (2008), 79, 123710.
(1)Van Berkel, GJ., Pasilis, S., Ovchinnikova, O. Established and Emerging Surface Sampling/Ionization Techniques for Mass Spectrometry, J. of Mass Spectrom. (2008), 43, 1161-1180. (Invited Tutorial Article Featured on Journal Cover)

Patents

Ovchinnikova, OS., Kertesz, V. Van Berkel, GJ. SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS. U.S. Patent No. 9,146,180. Patent Issued: September 29, 2015.
Ovchinnikova, OS., Jesse, S, Van Berkel, GJ. SPATIALLY RESOLVED THERMAL DESORPTION/IONIZATION COUPLED WITH MASS SPETROMETRY. U.S. Patent No. 8,384,020. Patent Issued: February 26, 2013.
Ovchinnikova, OS., Kertesz, V. Van Berkel, GJ. SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS. U.S. Patent No. 8,519,330. Patent Issued: August, 27 2013.
Ovchinnikova, OS., Kertesz, V. Van Berkel, GJ. SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS. U.S. Patent No. 8,742,338. Patent Issued: June 3, 2014.

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