Bio
Dr. Hsin-Yun (Joy) Chao is a R&D Associate in the electron Microscopy and Microanalysis Group at the Center for Nanophase Materials Sciences in ORNL. She earned her B.S. in Materials Science and Engineering from the University of Illinois at Urbana-Champaign, an M.S. from the University of Michigan at Ann Arbor, and a Ph.D. from the University of Maryland at College Park, with her principal doctoral research performed at the National Institute of Standards and Technology. Her doctoral research uses in-situ Environmental TEM (E-TEM) and Cryogenic Electron Microscopy (Cryo-EM) techniques to quantify interfacial interactions of nanotubes at the atomic-scale. Currently, her research at ORNL combines STEM with Cryo-EM to explore structural transformations in 2D quantum materials.