Jonathan D Poplawsky

Research Staff

Jonathan Poplawsky received his Ph.D. in Physics at Lehigh University in 2012 where he built an apparatus capable of a simultaneous cathodoluminescence and photoluminescence experiment. During his studies, he received the Lehigh University “Graduate Student Teaching Assistant Award” and founded the Lehigh University Physics Graduate Student Association. Following his graduate studies, Jonathan worked as post-doctoral research associate in the Scanning Transmission Electron Microscopy (STEM) group at Oak Ridge National Laboratory (ORNL) under Stephen J. Pennycook. Following his postdoctoral studies, Jonathan received a strategic hire award from ORNL to implement new capabilities within the Center for Nanophase Materials Sciences Atom Probe Tomography (APT) laboratory, and expand the lab's research beyond steels. His main research interests are focused on determining interfacial chemistry at the atomic level with the end goal of improving energy materials using Atom Probe Tomography. The material systems he works on are very diverse, including thin film solar cells, light-emitting diodes, battery technology, high temperature Al alloys, and energy efficient steels. Jonathan also excels with using focused ion beam, electron beam induced current, electron back scatter diffraction, cathodoluminescence, photoluminescence, and scanning transmission electron microscopy techniques.

Awards

2017 Most Notable CNMS User Project
2014 Ceramographic Exhibit 2nd place award, SEM, American Ceramic Society
2012 National Research Council Fellowship, Navy Research Laboratory
2011 Best Student Presentation Award, MAS CL Topical Conference
2010-2011 Sherman Fairchild Fellowship in Semiconductor Studies, Lehigh University
2008 Graduate Student Teaching Assistant Award, Lehigh University
2007 Excellence in Physics Award, University of Scranton2007 Sigma Pi Sigma Honors, University of Scranton
2003-2007 Loyola Scholarship, University of Scranton

Facilities

Atom probe tomography, focused ion beam, electron beam induced current, electron back scatter diffraction, cathodoluminescence, photoluminescence, and scanning transmission electron microscopy.

Specialized Equipment

Local Electrode Atom Probe (LEAP) 4000XHR
FEI Nova 200 Dual Beam SEM/FIB