Hans M Christen
Director, Neutron Scattering Division
Hans Christen received a Ph.D. in Physics from the Ecole Polytechnique Fédérale, Lausanne, Switzerland, in 1994 for research performed at the IBM Zurich Research Laboratory. After a post-doctoral appointment at ORNL, he joined Neocera, Inc., where he worked on development of pulsed-laser deposition equipment and scanning microwave measurements. He joined ORNL as a staff member in 2000 and led the Thin Films and Nanostructures Group from 2006 to 2013. In 2013, he became Associate Division Director within the Materials Science and Technology Division. He served as ORNL Manager for the DOE Materials Sciences and Engineering Program from 2011 to 2013. From January 2014 through August 2018, he led the Center for Nanophase Materials Sciences, before taking the role of Director, Neutron Scattering Division, in September 2018. Hans’s research has focused on the effects of epitaxial strain, spatial confinement, and interfacial mechanisms on the properties of complex-oxide thin films, in particular ferromagnetic, ferroelectric, and multiferroic perovskites.
Fellow, American Physical Society
Center for Nanophase Materials SciencesHigh Flux Isotope ReactorSpallation Neutron SourceAdvanced Photon SourceSLAC National Accelerator Laboratory
Ferroelectric Tunneling Element and Memory Applications which Utilize the Tunneling Element; US 7,759,713 B2 (Jun. 20, 2010); S.V. Kalinin, H.M. Christen, A.P. Baddorf, V. Meunier, and H.N. LeeApertured Probes for Localized Measurements of a Material’s Complex Permittivity and Fabrication Method; US 6,959,481 B2 (Nov. 1, 2005); R.L. Moreland, H.M. Christen, V.V. Talanov, and A.R. SchwartzSystem and Method for Quantitative Measurements of a Material’s Complex Permittivity with Use of Near-Field Microwave Probes; US 6,856,140 B2 (Feb. 15, 2005); V.V. Talanov, R.L. Moreland, A.R. Schwartz, and H. M. ChristenApertured Probes for Localized Measurements of a Material’s Complex Permittivity and Fabrication Method; US 6,680,617 B2 (Jan. 20, 2004); R.L. Moreland, H.M. Christen, V.V. Talanov, and A.R. SchwartzApparatus for Localized Measurements of Complex Permittivity of a Material; US 6,597,185 B1 (Jul. 22, 2003); V.V. Talanov, H.M. Christen, and R. MorelandCombinatorial Synthesis System; US 6,491,759 B1 (Dec. 10, 2002); H.M. Christen and S.D. SillimanScanned Focus Deposition System; US 6,497,193 B2 (Dec. 24, 2002); H.M. Christen