Arthur P Baddorf

Group Leader, Scanning Probe Microscopy

Art Baddorf has studied materials for over 30 years at Oak Ridge National Laboratory (ORNL). He is currently leader for the Scanning Probe Microscopy group at the Center for Nanophase Materials Sciences (CNMS), a Department of Energy Nanoscale Science Research Center. His group operates over 15 microscopes that use an extremely sharp tip to explore nanoscale objects and surfaces using either force (atomic force microscopy) or current (scanning tunneling microscopy). The techniques allow mapping of properties such as conductivity, polarization and ferroelectricity, magnetism, dielectric constant, thermal conductivity, and local density of electronic states at resolutions down to individual atoms. Art’s research interests focus on a fundamental understanding of the relationship between atomic structure and properties at oxide surfaces and interfaces, ferroelectric domain engineering, electron scattering and excitations, and energy flow at the nanoscale. Recent projects include pulsed laser synthesis of oxide thin films, ferroelectric properties of surfaces and ultrathin films, molecular self-assembly in 2D, and electronic transport in transition metal oxides. Art serves on a number of ORNL and national advisory boards and has published over 130 journal articles.EducationWheaton College, Wheaton, IL Math and Physics B.A., Summa Cum Laude, 1980University of Pennsylvania, PA Physics Ph.D., 1987Professional Experience2010–p Group Leader, Imaging and Nanoscale Characterization, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory 2010-p Joint Institute for Advanced Materials Research Affiliate2005–p Senior Research Staff Member, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory1990–2007 Research Staff Member, Low Dimensional Materials By Design, Materials Science and Technology Division, Oak Ridge National Laboratory1987–1989 Research Associate, Surface Physics Group, Solid State Division, Oak Ridge National LaboratoryProfessional and Synergistic Activities2015-p Institute for Functional Imaging Advisory Board2015-p Initiative Review Committee, ORNL Laboratory Directed Research and Development2015-p Journal of Physics D Advisory Panel2014-p ORNL Research Conflict of Interest Advisory Committee2014-p Nature Scientific Reports Editorial Board2010-p Group Leader, Imaging Functionality, Center For Nanophase Materials Sciences2010-p Program Advisory Board, Joint Institute for Advanced Materials2010-2013 Theme Leader, Electronic and Ionic Functionality, Center For Nanophase Materials Sciences2008-2010 Team Leader, Scanning Probe Imaging, Center For Nanophase Materials Sciences2008-2010 ORNL SEED Program Review Committee2005-p Active in scientific outreach to K-12 students1995–2004 Executive Board, Complex Materials Consortium CAT, Advanced Photon Source, Argonne, IL1991–92, 2002–03 President, Tennessee Valley Chapter of the American Vacuum Society2000 Lecturer, Louisiana State University Summer School1988–p Member: Materials Research Society, AVS, and American Physical Society


2017 Fellow of the AVS
2009 ORNL Significant Event Award for organization of 5th Annual Advanced PFM Workshop
2008 Cosslett Award for best invited paper at Microscopy & MicroAnalysis Conference
2006 ORNL Director’s Award Outstanding Team Accomplishment in Science and Technology
2006 ORNL Award for Science and Technology


Semiconductor Composition Containing Fe, Dy, and Tb, R. C. Pooser, B. J. Lawrie, A. P. Baddorf, A. Malasi, H. Taz, A. Farah, R. Kalyanaraman, G. Duscher, M. Patel, 2017.
Asymmetric Ferroelectric Tunneling Element (AFTE) and Applications for Non-Volatile Random Access Memory, S. V. Kalinin, H. M. Christen, A. P. Baddorf, and V. Meunier, 2010.
Ultra-high Density Ferroelectronic Storage and Lithography by Second Order Ferroelectroelastic Switching, S. V. Kalinin, A. Gruverman, Junsoo Shin, H. N. Lee, H. M. Christen, A. P. Baddorf, E. Karapetian, and M. Kachanov, 2006.
Fourier Transform for Acoustic Microscopy, S. Jesse, A. P. Baddorf, and S. V. Kalinin, patent disclosure.