portrait photo

Andrew R Lupini

Group Leader, Scanning Transmission Electron Microscopy Group


Dr. Lupini obtained his Ph.D. in Physics from the Cavendish Laboratory of Cambridge University in the UK, under the supervision of Dr. Andrew Bleloch, in 2001. Dr. Lupini is one of the inventors of the first aberration-corrector in a scanning transmission electron microscope to demonstrate an improved resolution. He is currently a R&D staff member in the Center for Nanophase Materials Sciences of Oak Ridge National Laboratory in Tennessee. His research interests include all forms of electron microscopy and spectroscopy, especially as applied to new or quantum materials.



  • 2021 – American Physical Society (APS). For groundbreaking contributions to the fields of electron microscopy and aberration-correction in scanning transmission electron microscopy and for the development of new image and spectroscopy capabilities, higher-resolution, and better sensitivity to atomic-resolution imaging and spectroscopy.
  • 2023 – Microscopy Society of America (MSA). For foundational contribution of theory and practice of aberration correction STEM, and applications for high-resolution EELS and e-beam atomic fabrication.

Other Awards

  • Winner of Microscopy Today Innovation Award 2019 – AICrystallographer
  • Winner of R&D 100 Award 2018 – The Atomic Forge
  • Winner of R&D 100 Award 2021 – UCC Ultraconductive Copper-CNT Composite
  • ORNL Research Accomplishment Award, 2023
  • ORNL Outstanding Scholarly Output Award, 2021
  • ORNL Significant Event Award, 2015 – An advanced multi-modal control system for high-speed data acquisition/analysis and nanofabrication for aberration-corrected STEM
  • ORNL Significant Event Award, 2014 – Super-Hydrophobic Materials Microscopy and Microanalysis journal Best Techniques and Instrumentation Development Paper (2012) – Single atom microscopy
  • Microscopy and Microanalysis journal Best Techniques and Instrumentation Development Paper (2011) – The three-dimensional point spread function of aberration-corrected scanning transmission electron microscopy