November 2023

Conference Paper

X-Ray Characterization of Atomistic Defects Causing Irradiation Creep of SiC

By:
Koyanagi, Takaaki ; Sprouster, David; Snead, Lance; Kato, Yutai
Book Title:
2020 ANS Virtual Winter Meeting summary
Publication Date:
November 2023
Conference Name:
2020 ANS Winter Meeting and Nuclear Technology Expo
Conference Location:
Chicago, Illinois, United States of America
Conference Sponsor:
GSE, Exelon, TerraPower