April 2012

Journal

Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors

By:
Levine, Lyle; Geantil, P.; Larson, Bennett C; Tischler, Jonathan Z; Kassner, Michael; Liu, W.
Journal Name:
Journal of Applied Crystallography
Page Number:
157-165
Volume:
45
Issue Number:
N/A
Publication Date:
April 2012
View DOI Listing:
https://doi.org/10.1107/S0021889812001616