July 2014

Conference Paper

Using X-mode L, R and O-mode reflectometry cutoffs to measure scrape-off-layer density profiles for upgraded ORNL reflectometer on NSTX-U

By:
Lau, Cornwall H; Wilgen, John B; Caughman, John B; Hanson, Gregory R; Hosea, Joel; Perkins, R. J.; Ryan, Philip M; Taylor, G.
Journal Name:
Review of Scientific Instruments
Page Number:
11D815
Volume:
85
Issue Number:
11
Publication Date:
July 2014
Conference Name:
High Temperature Plasma Diagnostics 2014
Conference Location:
Atlanta, Georgia, United States of America