March 2007

Journal

Three-Dimensional Micron-Resolution X-Ray Laue Diffraction Measurement of Thermal Grain-Evolution in Aluminum

By:
Budai, John D; Yang, Wenge ; Larson, Bennett C; Tischler, Jonathan Z; Liu, Wenjun ; Weiland, Hasso; Ice, Gene E
Journal Name:
Materials Science Forum
Page Number:
1373-1378
Volume:
467-470
Issue Number:
N/A
Publication Date:
March 2007