July 2006

Journal

Three Dimensional Imaging of Individual Hafnium Atoms at a Si/SiO2/HfO2 Dielectric Interface

By:
Baik, Hion; Van Benthem, Klaus ; Kim, Miyoung; Doh, SeokJoo; Luck, Julia T; Lupini, Andrew R; Lee, Jong-Hoo; Pennycook, Stephen J
Journal Name:
SAMSUNG Journal of Innovative Technology
Page Number:
335-339
Volume:
1
Issue Number:
1
Publication Date:
July 2006

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