February 2011

Book Chapter

The Electron Ronchigram

By:
Lupini, Andrew R
Page Number:
117-160
Volume:
N/A
Book Title:
Scanning Transmission Electron Microscopy
Publication Date:
February 2011
Publisher Location:
Springer, New York, New Jersey, United States of America

Abstract

The electron Ronchigram is a form of inline hologram that offers a convenient way to directly see and measure electron optical aberrations. Any user of an aberration-corrected STEM is likely to benefit from a basic understanding of how such an image is formed and used. This chapter will review the formation of the electron Ronchigram with a particular emphasis on the effects and measurement of aberrations. This review will be largely based on our own approach and previously published work.


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