August 2011

Conference Paper

Seeing Inside Materials by Aberration-Corrected Electron Microscopy

By:
Pennycook, Stephen J; Borisevich, Albina Y; Van Benthem, Klaus ; Oxley, Mark P; Luo, Weidong ; Oh, Sang Ho ; Kumar, Dhananjay ; Werner, P; Zakharov, N.; Molina Rubio, Sergio I; Marinopulos, Apostolos; Pantelides, Sokrates T
Publication Date:
August 2011
Conference Name:
ICAM 2008
Conference Location:
Kottayam, India
Conference Sponsor:
Mahatma Gandhi University, School of Chemical Sciences

Abstract

The motivation for aberration correction in electron microscopy was primarily to improve lateral resolution, and its successful achievement enabled the direct imaging of sub-�ngstrom lattice spacings in a crystal. However, the smaller probe results in greatly enhanced sensitivity for imaging individual atoms, and in addition, the wider useable aperture results in a smaller depth of field.

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