Resolution theory and static- and frequency dependent cross-talk in piezoresponse force microscopy

Abstract

Probing materials functionality locally by scanning probe microscopy requires reliable framework for identifying the target signal and separating it from the effects of surface morphology and instrument non-idealities, i.e. instrumental and topographical cross-talk. Here we develop the linear resolution theory framework to describe the cross-talk effects, and apply it for elucidation of frequency dependent cross-talk mechanisms in the Piezoresponse Force Microscopy. The use of band excitation method allows electromechanical/electrical and mechanical/topographic signals to be unambiguously separated. The applicability of functional fit approach and multivariate statistical analysis methods for data identification in band excitation SPM is explored.