November 2012

Journal

Rapid multidimensional data acquisition in scanning probe microscopy applied to local polarization dynamics and voltage dependent contact mechanics

By:
Jesse, Stephen ; Maksymovych, Petro ; Kalinin, Sergei V
Journal Name:
Applied Physics Letters
Page Number:
2980031
Volume:
93
Issue Number:
11
Publication Date:
November 2012
View DOI Listing:
https://doi.org/10.1063/1.2980031

Abstract

A rapid multidimensional spectroscopic imaging approach in scanning probe microscopy is developed and applied to piezoresponse force spectroscopy. Evolution of resonance frequency, dissipation, and piezoresponse signal at each point during acquisition of local hysteresis loops provides information on polarization dynamics and voltage dependent contact mechanics of ferroelectric surfaces. The measurements illustrate significant frequency shifts during piezoresponse force spectroscopy, necessitating the use of frequency-tracking methods. The method is universal and can be extended to other scanning probe microscopy techniques. (C) 2008 American Institute of Physics.


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