September 2026

Conference Paper

Quantifying Beam-sensitive Ionomer Distribution Across Fuel Cell Electrodes Using Automated Multi-scale, Low-dose Cryogenic TEM

By:
Oh, Juhyun ; Reeves, Kimberly S; van Cleve, Timothy; Cullen, David A; Zachman, Michael J
Journal Name:
Microscopy and Microanalysis
Page Number:
219-219
Volume:
32
Issue Number:
Supplement
Publication Date:
September 2026
Conference Name:
Microscopy and Microanalysis
Conference Location:
Milwaukee, Wisconsin, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1093/mam/ozag053.112