September 2016

Conference Paper

Quantifying Atomic Arrangements of Si/SiGe Heterostructure Interfaces

By:
Leonard, Donovan N; Dyck, Ondrej E; Poplawsky, Jonathan D; More, Karren L; Edge, Lisa; Jackson, Clayton; Pritchett, Emily; Deelman, Peter
Publication Date:
September 2016
Conference Name:
Microscopy & Microanalysis 2016
Conference Location:
Columbus, Indiana, United States of America