November 2023

Journal

Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy

By:
Wisinger, Nina ; Jesse, Stephen ; Carmichael, Ben D; Okatan, M.; Kravchenko, Ivan I; Kalinin, Sergei V; Tselev, Alexander
Journal Name:
Nanotechnology
Page Number:
065704
Volume:
28
Issue Number:
6
Publication Date:
November 2023