January 2016

Conference Paper

Programmer-Guided Reliability for Extreme-Scale Applications

By:
Bernholdt, David E; Elwasif, Wael R; Kartsaklis, Christos ; Lee, Seyong ; Mintz, Tiffany M
Page Number:
571-579
Publication Date:
January 2016
Conference Name:
Cluster Computing (CLUSTER), 2015 IEEE International Conference on
Conference Location:
Chicago, Illinois, United States of America
Conference Sponsor:
IEEE
View DOI Listing:
https://doi.org/10.1109/CLUSTER.2015.105