October 2013

Journal

Open loop Kelvin probe force microscopy with single and multi-frequency excitation

By:
Collins, Liam; Kilpatrick, J; Weber, S; Tselev, Alexander ; Vlassiouk, Ivan V; Ivanov, Ilia N; Jesse, Stephen ; Kalinin, Sergei V; Rodriguez, Brian
Journal Name:
Nanotechnology
Page Number:
475702
Volume:
24
Issue Number:
47
Publication Date:
October 2013
View DOI Listing:
https://doi.org/10.1088/0957-4484/24/47/475702