August 2006

Journal

Normal-Incidence Generalized Ellipsometry using the Two-Modulator Generalized Ellipsometry Microscope

By:
Jellison Jr, Gerald E; Hunn, John D; Rouleau, Christopher M
Journal Name:
Applied Optics
Page Number:
5479-5488
Volume:
45
Issue Number:
22
Publication Date:
August 2006

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