May 2025

Conference Paper

Multi-Label Classification with Constraint-Based Learning for Hierarchical Consistency

By:
Shivanna, Abhishek ; Hanson, Heidi A; Gounley, John P; Spannaus, Adam T
Page Number:
537-542
Book Title:
2025 IEEE Conference on Artificial Intelligence (CAI)
Publication Date:
May 2025
Publisher Location:
IEEE, New Jersey, United States of America
Conference Name:
IEEE Conference on Artificial Intelligence (CAI)
Conference Location:
Santa Clara, California, United States of America
Conference Sponsor:
NCI
View DOI Listing:
https://doi.org/10.1109/CAI64502.2025.00098

Abstract

We explore the limitations of traditional crossentropy loss in a hierarchical multi-label classification setting and introduce a novel loss function. This function is designed to integrate hierarchical constraints directly into the training process. By incorporating such constraints into the loss, our approach slightly improves the logical consistency of predictions in structured domains. We demonstrate the efficacy of our approach through experiments on primary site and histology classification by using electronic pathology reports. These results show that our proposed hierarchical loss function enhances the model's ability to produce predictions that are logically consistent with the natural data hierarchies, and it slightly improves predictive accuracy. Our framework may be extended to other hierarchical domains, however the performance gains are context specific.