July 2013

Journal

Microstructural characterization of Polycrystalline Materials by Synchrotron X-rays

By:
Wang, L; Li, Meimei; Almer, Jon; Bieler, T.; Barabash, Rozaliya I
Journal Name:
Frontiers of Materials Science
Page Number:
156-169
Volume:
7
Issue Number:
2
Publication Date:
July 2013
View DOI Listing:
https://doi.org/10.1007/s11706-013-0201-0