December 2017

Journal

Methodology for Wide Band-Gap Device Dynamic Characterization

By:
Tolbert, Leon M; Wang, Fei ; Blalock, Benjamin J; Jones, Edward A; Zhang, Zheyu; Guo, Ben
Journal Name:
IEEE Transactions on Power Electronics
Page Number:
9307-9318
Volume:
32
Issue Number:
12
Publication Date:
December 2017
View DOI Listing:
https://doi.org/10.1109/TPEL.2017.2655491