May 2017

Conference Paper

Mapping magnetic ordering with aberrated electron probes in STEM

By:
Idrobo Tapia, Juan C; Rusz, Jan; Spiegelberg, Jakob; McGuire, Michael A; Symons, Christopher T; Vatsavai, Ranga R; Cantoni, Claudia ; Lupini, Andrew R
Page Number:
1676-1677
Volume:
22
Publication Date:
May 2017
Conference Name:
Microscopy and Microanalysis
Conference Location:
Columbus, Indiana, United States of America
View DOI Listing:
https://doi.org/10.1017/S1431927616009223