August 2019

Conference Paper

Mapping Local Structural and Electronic Properties of 2D Materials by Multi-dimensional STEM

By:
Zachman, Michael J; Chi, Miaofang
Journal Name:
Microscopy and Microanalysis
Page Number:
960-961
Volume:
25
Issue Number:
S2
Publication Date:
August 2019
Conference Name:
Microscopy and Microanalysis 2019
Conference Location:
Portland, Oregon, United States of America
Conference Sponsor:
Microscopy Society of America
View DOI Listing:
https://doi.org/10.1017/S1431927619005531