November 2012

Journal

Mapping bias-induced phase stability and random fields in relaxor ferroelectrics

By:
Rodriguez, Brian; Jesse, Stephen ; Bokov, Alexei; Ye, Z.-G.; Kalinin, Sergei V
Journal Name:
Applied Physics Letters
Page Number:
3222868
Volume:
95
Issue Number:
9
Publication Date:
November 2012
View DOI Listing:
https://doi.org/10.1063/1.3222868

Abstract

The spatial variability of polarization reversal behavior in the relaxor 0.9Pb(Mg1/3Nb2/3O3)–0.1PbTiO3 crystal, is revealed on the ∼ 100 nm scale using switching spectroscopy piezoresponse force microscopy. Quenched fields conjugate to polarization are found, which show mesoscopic ( ∼ 100–200 nm) spatial fluctuations around near-zero bias values. The mapping of the stability gap of the bias-induced phase and conjugate random fields is demonstrated. The origin of the observed nanoscale domains and the field-induced part of the polarization are discussed.


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