August 2013

Conference Paper

Low Voltage STEM for the Study of Defects in 2D Materials

By:
Zhou, Wu ; Lee, Jaekwang ; Kapetanakis, Myron; Prange, Micah P; Lupini, Andrew R; Pantelides, Sokrates T; Idrobo Tapia, Juan C; Pennycook, Stephen J
Page Number:
1232-1233
Volume:
19
Publication Date:
August 2013
Conference Name:
Microscopy and Microanalysis
Conference Location:
Indianapolis, Indiana, United States of America

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