Local Electrode Atom Probe Characterization of Crept CMSX-4 Superalloy

Abstract

The solute distributions in crept and annealed single crystal CMSX-4 nickel-based superalloy have been characterized from multi-million atom data sets obtained with the local electrode atom probe. Solute-depleted and solute-enriched regions are evident on both sides of the �� - ���� interface. Ultrafine (~1 nm diameter) rhenium clusters containing up to ~10-15% Re were evident in the 10-nm wide Reenriched region in the matrix close to the �� - ���� interface. Re-enriched regions were also detected in asperities in the �� - ���� interface in the crept conditions.