July 2009

Conference Paper

Improved Performance of a Commercial SDD for X-ray Microanalysis

By:
Kenik, Edward A
Journal Name:
Microscopy and Microanalysis
Page Number:
560CD-561CD
Volume:
15
Issue Number:
N/A
Publication Date:
July 2009
Conference Name:
Microscopy and Microanalysis 2009
Conference Location:
Richmond, Virginia, United States of America
Conference Sponsor:
MSA, MAS, ISM

Abstract

The performance of a silicon drift detector (SDD) is evaluated for SEM-based x-ray microanalysis. The throughput, spectral fidelity and energy resolution are measured as a function of input count rate and detector time constant for two pulse processors. Post-acquisition processing to minimize the effects of pulse pile-up is discussed.