July 2006

Conference Paper

Imaging Au-Pd Nanoparticles with the Aberration-Corrected STEM/TEM

By:
Jose-Yacaman, Miguel; Mejia-Rosales, Sergio; Perez-Tijerina, Eduardo; Blom, Douglas ; Allard Jr, Lawrence F
Journal Name:
Microscopy and Microanalysis
Page Number:
1472CD
Volume:
12
Issue Number:
Supp 2
Publication Date:
July 2006
Conference Name:
Microscopy and Microanalysis 2006
Conference Location:
Chicago, Illinois, United States of America

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