February 2012

Journal

Grain boundary resistivities of polycrystalline Au films

By:
Zhang, X; Song, X. H.; Zhang, Xiaoguang ; Zhang, D. L.
Journal Name:
European Physics Letters
Page Number:
17010
Volume:
96
Issue Number:
1
Publication Date:
February 2012
View DOI Listing:
https://doi.org/10.1209/0295-5075/96/17010

Abstract

The surface and grain boundary resistivities of polycrystalline Au films are determined without any adjustable parameters by comparing the changes in residual resistivity and average grain size before and after annealing. The measured resistivity data point to a linear dependence of the surface roughness on the average grain size which suggests a self-similar scaling behavior.